2SK3472
2010-02-05
1
TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (π-MOS V)
2SK3472
Switching Regulator Applications
Low drain-source ON-resistance: RDS (ON) = 4.0 m (typ.)
High forward transfer admittance: |Yfs| = 0.8 S (typ.)
Low leakage current: IDSS = 100 μA (max) (VDS = 450 V)
Enhancement model: Vth = 2.0 to 4.0 V (VDS = 10 V, ID = 1 mA)
Absolute Maximum Ratings (Ta = 25°C)
Characteristic Symbol Rating Unit
Drain-source voltage VDSS 450 V
Drain-gate voltage (RGS = 20 kΩ) VDGR 450 V
Gate-source voltage VGSS ±30 V
DC (Note 1) ID 1 A
Drain current
Pulse (Note 1) IDP 2 A
Drain power dissipation (Tc = 25°C) PD 20 W
Single-pulse avalanche energy (Note 2) EAS 122 mJ
Avalanche current IAR 1 A
Repetitive avalanche energy (Note 3) EAR 2 mJ
Channel temperature Tch 150 °C
Storage temperature range Tstg 55 to150 °C
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability
Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e.
reliability test report and estimated failure rate, etc).
Thermal Characteristics
Characteristic Symbol Max Unit
Thermal resistance, channel to case Rth (ch-c) 6.25 °C/W
Thermal resistance, channel to ambient Rth (ch-a) 125 °C/W
Note 1: Ensure that the channel temperature does not exceed 150°C.
Note 2: VDD = 90 V, Tch = 25°C (initial), L = 203 mH, RG = 25 Ω, IAR = 1 A
Note 3: Repetitive rating: pulse width limited by maximum channel temperature
This transistor is an electrostatic-sensitive device. Handle with care.
Unit: mm
1.1 ± 0. 2
0.1 ± 0. 1
1.0 5 MAX.
2.3 ± 0. 15
5.2 ± 0. 2
0.8 M A X.
0.6 M A X.
9.5 ± 0. 3
1.2 M A X.
1.5 ± 0. 2
6.5 ± 0. 2
1
2
3
0.6 M A X.
5.5 ± 0. 2
0.6 ± 0. 15
2.3 ± 0. 2
2.3 ± 0. 15
1. G ATE
2. DRAIN
HEAT SINK
3. SOURSE
3
2
1
JEDEC
JEITA
TOSHIBA 2-7J1B
Weight: 0.36 g (typ.)
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2SK3472
2010-02-05
2
Electrical Characteristics (Ta = 25°C)
Characteristic Symbol Test Condition Min Typ. Max Unit
Gate leakage current IGSS VGS = ±25 V, VDS = 0 V ±10 μA
Drain-source breakdown voltage V (BR) GSS IG = ±10 μA, VDS = 0 V ±30 V
Drain cutoff current IDSS V
DS = 450 V, VGS = 0 V 100 μA
Drain-source breakdown voltage V (BR) DSS ID = 10 mA, VGS = 0 V 450 V
Gate threshold voltage Vth V
DS = 10 V, ID = 1 mA 2.0 4.0 V
Drain-source ON-resistance RDS (ON) V
GS = 10 V, ID = 0.5 A 4.0 4.6 Ω
Forward transfer admittance Yfs V
DS = 10 V, ID = 0.5 A 0.3 0.8 S
Input capacitance Ciss 180
Reverse transfer capacitance Crss 2
Output capacitance Coss
VDS = 25 V, VGS = 0 V, f = 1 MHz
20
pF
Rise time tr 7
Turn-on time ton 15
Fall time tf 30
Switching time
Turn-off time toff
70
ns
Total gate charge
(gate-source plus gate-drain) Qg 5
Gate-source charge Qgs 3
Gate-drain (“Miller”) charge Qgd
VDD 360 V, VGS = 10 V, ID = 1 A
2
nC
Source-Drain Ratings and Characteristics (Ta = 25°C)
Characteristic Symbol Test Condition Min Typ. Max Unit
Continuous drain reverse current (Note 1) IDR 1 A
Pulse drain reverse current (Note 1) IDRP 2 A
Forward voltage (diode) VDSF I
DR = 1 A, VGS = 0 V 1.7
V
Reverse recovery time trr 350 μs
Reverse recovery charge Qrr
IDR = 1 A, VGS = 0 V,
dIDR/dt = 100 A/μs 1.3 μC
Marking
K3472
Lot No.
Note 4
Part No.
(or abbreviation code)
Duty 1%, tw = 10 μs
0 V
10 V
VGS
RL = 400 Ω
VDD 200 V
ID = 0.5 A
VOUT
10 Ω
Note 4 : A line under a Lot No. identifies the indication of product Labels
[[G]]/RoHS COMPATIBLE or [[G]]/RoHS [[Pb]]
Please contact your TOSHIBA sales representative for details as to
environmental matters such as the RoHS compatibility of Product.
The RoHS is Directive 2002/95/EC of the European Parliament and
of the Council of 27 January 2003 on the restriction of the use of certain
hazardous substances in electrical and electronic equipment.
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2SK3472
2010-02-05
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Drain-source voltage VDS (V)
Drain-source voltage VDS (V)
ID – VDS
Drain current ID (A)
Drain-source voltage VDS (V)
ID – VDS
Drain current ID (A)
Gate-source voltage VGS (V)
ID – VGS
Drain current ID (A)
Gate-source voltage VGS (V)
VDS – VGS
0
1.0
0.2
0.6
0.4
0.8
2 0 10
4 6 8
Common source
Tc = 25°C
pulse test
VGS = 4.5 V
5.0
5.25
5.5
5.75
10
8.0
6.0
4.75
0
2.0
0.4
1.2
0.8
1.6
10050
20 30 40
VGS = 4.5 V
6.25
5.25
5.5
5.75
6.0
10 Common source
Tc = 25°C
pulse test
8.0
5.0
Common source
VDS = 20 V
pulse test
0
2.0
0.4
1.2
0.8
1.6
2 0 10
4 6 8
Tc = 55°C
25
100
0
20
4
12
8
16
40 20
8 12 16
0.25
Common source
Tc = 25°C
pulse test
0.5
ID = 1 A
Drain current ID (A)
RDS (ON) ID
Drain-source ON-resistance
RDS (ON) (Ω)
0.1 1
0.3 0.5 3 5
3
30
10
50
1
VGS = 10, 15 V
10
Common source
Tc = 25°C
pulse test
5
Forward transfer admittance Yfs (S)
Drain current ID (A)
Yfs ID
0.02
0.01
10
10
3
1
0.1
0.3
1 3 0.3
0.05
0.5
5
Common source
VDS = 20 V
pulse test
Tc = 55°C 25
100
0.1
0.03
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2010-02-05
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Drain power dissipation PD (W)
Gate threshold voltage Vth (V)
Drain-source voltage VDS (V)
IDR VDS
Drain reverse current IDR (A)
Drain-source voltage VDS (V)
Capacitance – VDS
Capacitance C (pF)
Case temperature Tc (°C)
Vth Tc
Case temperature Tc (°C)
PD Tc
Drain-source voltage VDS (V)
Gate-source voltage VGS (V)
Total gate charge Qg (nC)
Dynamic input/output characteristics
0.01
10
0.03
0.3
3
0.201.2
0.6 0.4 0.8 1.0
10
3
1VGS = 0, 1 V
1
0.1
Common source
pulse test
40
10
20
30
0
0 80 120 20040 160
500
100
300
200
400
0
0 40 60 80 10020
Common source
ID = 1 A
Tc = 25°C
p
ulse test
180
VDS = 360 V
VGS
VDS
20
4
12
8
16
0
90
0 40 80 120 160
5
1
3
2
4
0
80 40
Common source
VDS = 10 V
ID = 1 mA
pulse test
10
30
100
1 0.1 10010
Ciss
Coss
Crss
Common source
VGS = 0 V
f = 1 MHz
Tc = 25°C
1
3
50
300
0.3 0.5 3 5 30 50
500
5
Case temperature Tc (°C)
RDS (ON) Tc
Drain-source ON-resistance RDS (ON) (Ω)
0
16
1
8
2
12
40 80 160
0 40 80
Common source
VGS = 10 V
pulse test
0.25
ID = 1 A
0.5
120
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2SK3472
2010-02-05
5
10 μ 100 μ 1 m 10 m 100 m 1 10
0.01
0.03
0.1
1
10
Single pulse
0.01
0.02
0.05
0.1
0.2
Duty = 0.5
T
PDM
t
Duty = t/T
Rth (ch-c) = 6.25°C/W
0.3
3
rth tw
EAS – Tch
Pulse width tw (s)
Channel temperature (initial) Tch (°C)
Normalized transient thermal impedance
rth (t)/Rth (ch-a)
Avalanche energy EAS (mJ)
Safe operating area
Drain-source voltage VDS (V)
Drain current ID (A)
0.01
1
0.1
1
10
30
10 100 1000
*: Single nonrepetitive pulse
Tc = 25°C
Curves must be derated
linearly with increase in
temperature.
ID max (continuous)
ID max (pulsed) *
DC operation
Tc = 25°C
1 ms *
VDSS max
3
0.03
0.3
100 μs *
0
25
30
60
90
150
120
50 75 100 125 150
Waveform
IAR
BVDSS
VDD V
DS
RG = 25 Ω
VDD = 90 V, L = 203 mH
= VDD
BVDSS
BVDSS
2
IL
2
1
ΕAS
Test circuit
15 V
15 V
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2SK3472
2010-02-05
6
RESTRICTIONS ON PRODUCT USE
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in this document, and related hardware, software and systems (collectively “Product”) without notice.
This document and any information herein may not be reproduced without prior written permission from TOSHIBA. Even with
TOSHIBA’s written permission, reproduction is permissible only if reproduction is without alteration/omission.
Though TOSHIBA works continually to improve Product’s quality and reliability, Product can malfunction or fail. Customers are
responsible for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and
systems which minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily
injury or damage to property, including data loss or corruption. Before customers use the Product, create designs including the
Product, or incorporate the Product into their own applications, customers must also refer to and comply with (a) the latest versions of
all relevant TOSHIBA information, including without limitation, this document, the specifications, the data sheets and application notes
for Product and the precautions and conditions set forth in the “TOSHIBA Semiconductor Reliability Handbook” and (b) the
instructions for the application with which the Product will be used with or for. Customers are solely responsible for all aspects of their
own product design or applications, including but not limited to (a) determining the appropriateness of the use of this Product in such
design or applications; (b) evaluating and determining the applicability of any information contained in this document, or in charts,
diagrams, programs, algorithms, sample application circuits, or any other referenced documents; and (c) validating all operating
parameters for such designs and applications. TOSHIBA ASSUMES NO LIABILITY FOR CUSTOMERS’ PRODUCT DESIGN OR
APPLICATIONS.
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equipment, industrial robots and home electronics appliances) or for specific applications as expressly stated in this document.
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or related software or technology are strictly prohibited except in compliance with all applicable export laws and regulations.
Please contact your TOSHIBA sales representative for details as to environmental matters such as the RoHS compatibility of Product.
Please use Product in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances,
including without limitation, the EU RoHS Directive. TOSHIBA assumes no liability for damages or losses occurring as a result of
noncompliance with applicable laws and regulations.
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