DM74LS00M - National Semiconductor - Datasheet.Technology

TL/F/6439

54LS00/DM54LS00/DM74LS00 Quad 2-Input NAND Gates

June 1989

54LS00/DM54LS00/DM74LS00

Quad 2-Input NAND Gates

General Description

This device contains four independent gates each of which

performs the logic NAND function.

Features

YAlternate Military/Aerospace device (54LS00) is avail-

able. Contact a National Semiconductor Sales Office/

Distributor for specifications.

Connection Diagram

Dual-In-Line Package

TL/F/6439–1

Order Number 54LS00DMQB, 54LS00FMQB, 54LS00LMQB, DM54LS00J, DM54LS00W, DM74LS00M or DM74LS00N

See NS Package Number E20A, J14A, M14A, N14A or W14B

Function Table

YeAB

Inputs Output

AB Y

LL H

LH H

HL H

HH L

High Logic Level

LeLow Logic Level

C1995 National Semiconductor Corporation RRD-B30M105/Printed in U. S. A.

Absolute Maximum Ratings (Note)

If Military/Aerospace specified devices are required,

please contact the National Semiconductor Sales

Office/Distributors for availability and specifications.

Supply Voltage 7V

Input Voltage 7V

Operating Free Air Temperature Range

DM54LS and 54LS b55§Ctoa

125§C

DM74LS 0§Ctoa

70§C

Storage Temperature Range b65§Ctoa

150§C

Note:

The ‘‘Absolute Maximum Ratings’’ are those values

beyond which the safety of the device cannot be guaran-

teed. The device should not be operated at these limits. The

parametric values defined in the ‘‘Electrical Characteristics’’

table are not guaranteed at the absolute maximum ratings.

The ‘‘Recommended Operating Conditions’’ table will define

the conditions for actual device operation.

Recommended Operating Conditions

Symbol Parameter DM54LS00 DM74LS00 Units

Min Nom Max Min Nom Max

VCC Supply Voltage 4.5 5 5.5 4.75 5 5.25 V

VIH High Level Input Voltage 2 2 V

VIL Low Level Input Voltage 0.7 0.8 V

IOH High Level Output Current b0.4 b0.4 mA

IOL Low Level Output Current 4 8 mA

TAFree Air Operating Temperature b55 125 0 70 §C

Electrical Characteristics over recommended operating free air temperature range (unless otherwise noted)

Symbol Parameter Conditions Min Typ Max Units

(Note 1)

VIInput Clamp Voltage VCC eMin, IIeb

18 mA b1.5 V

VOH High Level Output VCC eMin, IOH eMax, DM54 2.5 3.4 V

Voltage VIL eMax DM74 2.7 3.4

VOL Low Level Output VCC eMin, IOL eMax, DM54 0.25 0.4

Voltage VIH eMin DM74 0.35 0.5 V

IOL e4 mA, VCC eMin DM74 0.25 0.4

IIInput Current @Max VCC eMax, VIe7V 0.1 mA

Input Voltage

IIH High Level Input Current VCC eMax, VIe2.7V 20 mA

IIL Low Level Input Current VCC eMax, VIe0.4V b0.36 mA

IOS Short Circuit VCC eMax DM54 b20 b100 mA

Output Current (Note 2) DM74 b20 b100

ICCH Supply Current with VCC eMax 0.8 1.6 mA

Outputs High

ICCL Supply Current with VCC eMax 2.4 4.4 mA

Outputs Low

Switching Characteristics at VCC e5V and TAe25§C (See Section 1 for Test Waveforms and Output Load)

RLe2kX

Symbol Parameter CLe15 pF CLe50 pF Units

Min Max Min Max

tPLH Propagation Delay Time 310415ns

Low to High Level Output

tPHL Propagation Delay Time 310415ns

High to Low Level Output

Note 1: All typicals are at VCC e5V, TAe25§C.

Note 2: Not more than one output should be shorted at a time, and the duration should not exceed one second.

Physical Dimensions inches (millimeters)

Ceramic Leadless Chip Carrier Package (E)

Order Number 54LS00LMQB

NS Package Number E20A

Physical Dimensions inches (millimeters)

14-Lead Ceramic Dual-In-Line Package (J)

Order Number 54LS00DMQB or DM54LS00J

NS Package Number J14A

14-Lead Small Outline Molded Package (M)

Order Number DM74LS00M

NS Package Number M14A

Physical Dimensions inches (millimeters) (Continued)

14-Lead Molded Dual-In-Line Package (N)

Order Number DM74LS00N

NS Package Number N14A

54LS00/DM54LS00/DM74LS00 Quad 2-Input NAND Gates

Physical Dimensions inches (millimeters) (Continued)

14-Lead Ceramic Flat Package (W)

Order Number 54LS00FMQB or DM54LS00W

NS Package Number W14B

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SEMICONDUCTOR CORPORATION. As used herein:

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systems which, (a) are intended for surgical implant support device or system whose failure to perform can

into the body, or (b) support or sustain life, and whose be reasonably expected to cause the failure of the life

failure to perform, when properly used in accordance support device or system, or to affect its safety or

with instructions for use provided in the labeling, can effectiveness.

be reasonably expected to result in a significant injury

to the user.

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